Avinton
Detection of defective products in semiconductor IC chips

We have developed an AI system that can detect defects among approximately 3,000 IC chips embedded in a single semiconductor wafer. A single wafer image can be read at a processing speed of 4 seconds or less at the shortest, and even small defects that could not be detected until now can be detected […]

May 24, 2021 / Last updated : May 24, 2021 komura5791 Device sensor

JUKI
High speed smart modular mounter

By reading the RFID tag attached to the nozzle and the RFID reader attached to the main unit, the "takumi head" that adjusts the recognition sensor according to the height of each individual nozzle increases the height by one step, resulting in a more optimal head height. It is possible to mount parts in the […]